Collection of papers relating to electron channelling contrast in the scanning electron microscope (SEM), including electron channelling patterns (ECPs) which show the variation of electron signal (typically the back scattered electron intensity) with incident beam direction which reveal the crystallography of the sample, and electron channelling contrast images (ECCIs) showing the spatial variation of the selected signal and reveal local defects in the crystal lattice.
The methods were conceived in the 1960s, and there have been several periods of active research over the intervening decades. The performance of current SEMs makes the method an attractive alternative to TEM for routine diffraction contrast imaging and characterisation of lattice defects in crystalline samples.
Please get in touch with the collection editor Angus Wilkinson to add papers.
Many thanks, @AngusJWilkinson!